SN74LVTH18646APM TEXAS INSTRUMENTS IC SCAN-TEST-DEV/XCVR 64-LQFP ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10)

Part Nnumber
SN74LVTH18646APM
Description
IC SCAN-TEST-DEV/XCVR 64-LQFP ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10)
Producer
TEXAS INSTRUMENTS
Basic price
15,39 EUR

The product with part number SN74LVTH18646APM (IC SCAN-TEST-DEV/XCVR 64-LQFP ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10)) is from company TEXAS INSTRUMENTS and distributed with basic unit price 15,39 EUR. Minimal order quantity is 160 pc, Approx. production time is 42 weeks.


Categories Integrated Circuits (ICs) Logic - Specialty Logic Manufacturer Texas Instruments Series 74LVTH Packaging Tray Part Status Active Logic Type ABT Scan Test Device With Transceivers and Registers Supply Voltage 2.7 V ~ 3.6 V Number of Bits 18 Operating Temperature -40°C ~ 85°C Mounting Type Surface Mount Package / Case 64-LQFP Supplier Device Package 64-LQFP (10x10)


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